2

Burn-in effect on yield

Year:
2000
Language:
english
File:
PDF, 194 KB
english, 2000
14

A nonparametric Bayes approach to decide system burn-in time

Year:
1997
Language:
english
File:
PDF, 132 KB
english, 1997
19

Use of the dirichlet process for reliability analysis

Year:
1994
Language:
english
File:
PDF, 318 KB
english, 1994
36

A flexible portable proton exchange membrane fuel cell

Year:
2012
Language:
english
File:
PDF, 1.80 MB
english, 2012
45

Wide Dynamic Range CMOS Potentiostat for Amperometric Chemical Sensor

Year:
2010
Language:
english
File:
PDF, 603 KB
english, 2010